Introduction
The fully automatic semiconductor surge current tester CSG-510 is used to evaluate the performance of semiconductor clamp absorption elements.
Applications:
Mobile phones, security and other industries to surge protection components for detection
Product features
7 inch touch LCD interface, rich in functions, easy to operate, easy to upgrade software
User programmable test program, up to 1000 sets of memory
Built-in coupling and decoupling network
Built-in waveform detection attenuator, can be directly observed with an oscilloscope
Intelligent program-controlled high-voltage power supply, built-in high-voltage overpressure, overcurrent, short-circuit protection
Technical parameters
Open output voltage
1kV (Max) ±5％
Pre-wave time
The slow front can be customized with a ± 30% of 1.2 s
Pulse half peak time
50μs ±20％
Short-circuit output current
Up to 500A ±5% (at 2 ohm impedance)
Pre-wave time
8μs ±20％
Pulse half peak time
20μs ±20％
Output polarity
Positive, negative, positive and negative cycles, positive and negative alternate, positive and negative first, negative and positive
Output impedance
2Ω，12Ω，24Ω±10％
The way the surge is triggered
Automatic or manual, triggered at a single time
The number of surges
1-9999 times
Programmable tester
Built-in IEC standards and user-defined programs for up to 1000 groups
Surge interval time
3-9999s
Built-in network coupling
Direct coupling, diodes/diodes, diodes/inductors, capacitors/inductors, capacitors/diodes
Use the environment
Temperature: 10%-75% relative humidity at 15C-35C
System power
AC220±10％，50/60Hz
Form factor
470mm wide× 260mm high× 500mm deep
Weight of the whole machine
About 20kg
